A study of dielectric occuluded void using partial discharge height and the development of a novel void quantification method /

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Bibliographic Details
Main Author: Chia, Poh Yong
Format: Thesis Book
Language:English
Published: 2000.
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035 |a ACR-4695 
040 |a UMM 
090 |a TK76  |b NUS 2000 Chi 
100 1 0 |a Chia, Poh Yong. 
245 1 2 |a A study of dielectric occuluded void using partial discharge height and the development of a novel void quantification method /  |c Chia Poh Yong. 
260 |c 2000. 
300 |a xi, 120 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Eng.) -- National University of Singapore, 2000. 
504 |a Bibliography : p. 99-101. 
948 |a 01/11/2001  |b 06/11/2002 
596 |a 1 
999 |a TK76 NUS 2000 CHI  |w LC  |c 1  |i A510540917  |l B_KOM4  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 19/11/2002  |o .PUBLIC. BKOM 4 : 45420