Lee, K. W. (2000). Reduction of charging effects using pseudo-random scanning in the scanning electron microscope.
Chicago Style (17th ed.) CitationLee, Kok Wah. Reduction of Charging Effects Using Pseudo-random Scanning in the Scanning Electron Microscope. 2000.
MLA (8th ed.) CitationLee, Kok Wah. Reduction of Charging Effects Using Pseudo-random Scanning in the Scanning Electron Microscope. 2000.
Warning: These citations may not always be 100% accurate.