APA引文

Lee, K. W. (2000). Reduction of charging effects using pseudo-random scanning in the scanning electron microscope.

Chicago Style (17th ed.) Citation

Lee, Kok Wah. Reduction of Charging Effects Using Pseudo-random Scanning in the Scanning Electron Microscope. 2000.

MLA引文

Lee, Kok Wah. Reduction of Charging Effects Using Pseudo-random Scanning in the Scanning Electron Microscope. 2000.

警告：这些引文格式不一定是100％准确.