Ng Tsu Hau. (2000). Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability.
Chicago Style (17th ed.) CitationNg Tsu Hau. Instrumentation Development of an Automated Integrated Test System (AITS) for the Characterization of Hot-carrier and Oxide Reliability. 2000.
MLA (8th ed.) CitationNg Tsu Hau. Instrumentation Development of an Automated Integrated Test System (AITS) for the Characterization of Hot-carrier and Oxide Reliability. 2000.
Warning: These citations may not always be 100% accurate.