Ng Tsu Hau. (2000). Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability.
توثيق أسلوب شيكاغو (الطبعة السابعة عشر)Ng Tsu Hau. Instrumentation Development of an Automated Integrated Test System (AITS) for the Characterization of Hot-carrier and Oxide Reliability. 2000.
توثيق جمعية اللغة المعاصرة MLA (الطبعة الثامنة)Ng Tsu Hau. Instrumentation Development of an Automated Integrated Test System (AITS) for the Characterization of Hot-carrier and Oxide Reliability. 2000.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.