APA引文

Ng Tsu Hau. (2000). Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability.

Chicago Style (17th ed.) Citation

Ng Tsu Hau. Instrumentation Development of an Automated Integrated Test System (AITS) for the Characterization of Hot-carrier and Oxide Reliability. 2000.

MLA引文

Ng Tsu Hau. Instrumentation Development of an Automated Integrated Test System (AITS) for the Characterization of Hot-carrier and Oxide Reliability. 2000.

警告：这些引文格式不一定是100％准确.