Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
2000.
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| Physical Description: | xvi, 117 leaves : ill. ; 30 cm. |
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| Bibliography: | Bibliography : leaves 106-112. |