Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability /
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| 主要作者: | |
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| 格式: | Thesis 圖書 |
| 語言: | English |
| 出版: |
2000.
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| 實物描述: | xvi, 117 leaves : ill. ; 30 cm. |
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| 參考書目: | Bibliography : leaves 106-112. |