Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability /

Saved in:
Bibliographic Details
Main Author: Ng Tsu Hau
Format: Thesis Book
Language:English
Published: 2000.
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Physical Description:xvi, 117 leaves : ill. ; 30 cm.
Bibliography:Bibliography : leaves 106-112.