Liang, M. K. (2002). Oxidation-induced stacking fault in (100) and (111) silicon wafers.
Chicago Style (17th ed.) CitationLiang, Mei Keat. Oxidation-induced Stacking Fault in (100) and (111) Silicon Wafers. 2002.
MLA (8th ed.) CitationLiang, Mei Keat. Oxidation-induced Stacking Fault in (100) and (111) Silicon Wafers. 2002.
Warning: These citations may not always be 100% accurate.