Liang, M. K. (2002). Oxidation-induced stacking fault in (100) and (111) silicon wafers.
Chicago Style (17th ed.) CitationLiang, Mei Keat. Oxidation-induced Stacking Fault in (100) and (111) Silicon Wafers. 2002.
MLA引文Liang, Mei Keat. Oxidation-induced Stacking Fault in (100) and (111) Silicon Wafers. 2002.
警告:这些引文格式不一定是100%准确.