Oxidation-induced stacking fault in (100) and (111) silicon wafers /

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Bibliographic Details
Main Author: Liang, Mei Keat
Format: Thesis Book
Language:English
Published: 2002.
Subjects:
Online Access:http://studentsrepo.um.edu.my/id/eprint/2316
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Description
Physical Description:xiii, 111 leaves : ill., (some col.) ; 30 cm.
Bibliography:Bibliography: p. 101-103.