Koh, L. T. (2000). Investigation of the quality and reliability of copper interconnects.
Chicago Style (17th ed.) CitationKoh, Leong Tee. Investigation of the Quality and Reliability of Copper Interconnects. 2000.
MLA (8th ed.) CitationKoh, Leong Tee. Investigation of the Quality and Reliability of Copper Interconnects. 2000.
Warning: These citations may not always be 100% accurate.