Koh, L. T. (2000). Investigation of the quality and reliability of copper interconnects.
Chicago Style (17th ed.) CitationKoh, Leong Tee. Investigation of the Quality and Reliability of Copper Interconnects. 2000.
MLA引文Koh, Leong Tee. Investigation of the Quality and Reliability of Copper Interconnects. 2000.
警告:这些引文格式不一定是100%准确.