Tan, L. C. P. (2001). Characterisation of shallow dopant profiles in semiconductors by spreading resistance profiling.
Chicago Style (17th ed.) CitationTan, Louison Cheng Pheng. Characterisation of Shallow Dopant Profiles in Semiconductors by Spreading Resistance Profiling. 2001.
MLA (8th ed.) CitationTan, Louison Cheng Pheng. Characterisation of Shallow Dopant Profiles in Semiconductors by Spreading Resistance Profiling. 2001.
Warning: These citations may not always be 100% accurate.