APA引文

Tan, L. C. P. (2001). Characterisation of shallow dopant profiles in semiconductors by spreading resistance profiling.

Chicago Style (17th ed.) Citation

Tan, Louison Cheng Pheng. Characterisation of Shallow Dopant Profiles in Semiconductors by Spreading Resistance Profiling. 2001.

MLA引文

Tan, Louison Cheng Pheng. Characterisation of Shallow Dopant Profiles in Semiconductors by Spreading Resistance Profiling. 2001.

警告：這些引文格式不一定是100％准確.