Study on dual gate oxide integrity for system-on-a-chip technology /

Saved in:
Bibliographic Details
Main Author: Zhuang, Ziyun
Format: Thesis Book
Language:English
Published: 2002.
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Physical Description:viii, 68 leaves : ill. ; 30 cm.
Bibliography:Bibliography: leaves 65-66.