Characterization of mos transistor mismatch for sub-micron process in analog application /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
2002.
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| LEADER | 00725cam a2200205 a 4500 | ||
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| 001 | u505672 | ||
| 003 | SIRSI | ||
| 008 | 020917s2002 si v 00 1 eng m | ||
| 035 | |a ACW-0498 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUS 2002 Yeo | ||
| 100 | 1 | 0 | |a Yeo, Siok Been. |
| 245 | 1 | 0 | |a Characterization of mos transistor mismatch for sub-micron process in analog application / |c Yeo Siok Been. |
| 260 | |c 2002. | ||
| 300 | |a xx, 217 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 2002. | ||
| 504 | |a Bibliography: leaves 199-206. | ||
| 948 | |a 22/10/2002 |b 24/12/2002 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUS 2002 YEO |w LC |c 1 |i A510949898 |l B_KOM4 |m P01UTAMA |r Y |s Y |t TESIS |u 16/1/2003 |o .PUBLIC. BKOM 4 : 46023 | ||