Characterization of mos transistor mismatch for sub-micron process in analog application /
Saved in:
Main Author: | Yeo, Siok Been |
---|---|
Format: | Thesis Book |
Language: | English |
Published: |
2002.
|
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Flicker noise characterization of trapping effects in submicrometer Mos transistors /
by: Yeo, Boon Pian
Published: (1998) -
Nickel silicide integration issues in SI deep sub-micron technologies /
by: Tan, Wee Leng
Published: (2001) -
Characterization of hot-carrier degradation in submicrometer MOS transistors /
by: Ang, Diing Shenp
Published: (1997) -
Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
by: Qin, Wei Han
Published: (1998) -
Design and construction of charge pumping technique for MOS transistor characterization /
by: Lee, Hock Guan
Published: (2004)