Liu, R. (2001). Magnetic-sector SIMS depth profiling of Si/SiGe heterostructures.
Chicago Style (17th ed.) CitationLiu, Rong. Magnetic-sector SIMS Depth Profiling of Si/SiGe Heterostructures. 2001.
MLA (8th ed.) CitationLiu, Rong. Magnetic-sector SIMS Depth Profiling of Si/SiGe Heterostructures. 2001.
Warning: These citations may not always be 100% accurate.