APA引文

Liu, R. (2001). Magnetic-sector SIMS depth profiling of Si/SiGe heterostructures.

Chicago Style (17th ed.) Citation

Liu, Rong. Magnetic-sector SIMS Depth Profiling of Si/SiGe Heterostructures. 2001.

MLA引文

Liu, Rong. Magnetic-sector SIMS Depth Profiling of Si/SiGe Heterostructures. 2001.

警告：这些引文格式不一定是100％准确.