Magnetic-sector SIMS depth profiling of Si/SiGe heterostructures /

Magnetic-sector SIMS depth profiling of Si/SiGe heterostructures /

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Liu, Rong
التنسيق:	أطروحة كتاب
اللغة:	English
منشور في:	2001.
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

مواد مشابهة

Modelling and Simulation of Si/SiGe Heterostructure Devices
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Characterization of ge-doped optical fiber for use as thermoluminescent dosimeter in the diagnostic x-ray region /
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Kaba Si Untuang Sudah : suatu analisis teks dan struktur /
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