Characterisation of GE nanocrystals in silicon oxide /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
2001.
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| LEADER | 00703nam a2200205 a 4500 | ||
|---|---|---|---|
| 001 | u506675 | ||
| 003 | SIRSI | ||
| 008 | 021119s2001 si a v 00 10 eng m | ||
| 035 | |a ACW-3804 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUS 2001 Ho | ||
| 100 | 1 | 0 | |a Ho, Yew Wee. |
| 245 | 1 | 0 | |a Characterisation of GE nanocrystals in silicon oxide / |c Ho Yew Wee. |
| 260 | |c 2001. | ||
| 300 | |a xi, 122 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 2001. | ||
| 504 | |a Bibliography: |a Includes bibliographical references. | ||
| 948 | |a 19/11/2002 |b 19/11/2002 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUS 2001 HO |w LC |c 1 |i A510670714 |l B_KOM4 |m P01UTAMA |r Y |s Y |t TESIS |u 3/12/2002 |o .PUBLIC. BKOM 4 : 45263 | ||