Kok, C. K. (2000). Investigation of hot-carrier degradation in surface and buried channel pmosfets.
Chicago Style (17th ed.) CitationKok, Chee Kean. Investigation of Hot-carrier Degradation in Surface and Buried Channel Pmosfets. 2000.
MLA (8th ed.) CitationKok, Chee Kean. Investigation of Hot-carrier Degradation in Surface and Buried Channel Pmosfets. 2000.
Warning: These citations may not always be 100% accurate.