APA引文

Kok, C. K. (2000). Investigation of hot-carrier degradation in surface and buried channel pmosfets.

Chicago Style (17th ed.) Citation

Kok, Chee Kean. Investigation of Hot-carrier Degradation in Surface and Buried Channel Pmosfets. 2000.

MLA引文

Kok, Chee Kean. Investigation of Hot-carrier Degradation in Surface and Buried Channel Pmosfets. 2000.

警告：這些引文格式不一定是100％准確.