Investigation of hot-carrier degradation in surface and buried channel pmosfets/
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
2000.
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| LEADER | 00710nam a2200205 a 4500 | ||
|---|---|---|---|
| 001 | u506881 | ||
| 003 | SIRSI | ||
| 008 | 021122s2000 si a v 00 10 eng m | ||
| 035 | |a ACW-4411 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUS 2000 Kok | ||
| 100 | 1 | 0 | |a Kok, Chee Kean. |
| 245 | 1 | 0 | |a Investigation of hot-carrier degradation in surface and buried channel pmosfets/ |c Kok Chee Kean. |
| 260 | |c 2000. | ||
| 300 | |a xix, 111 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 2000. | ||
| 504 | |a Bibliography: 107-111. | ||
| 948 | |a 22/11/2002 |b 22/11/2002 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUS 2000 KOK |w LC |c 1 |i A510552815 |l B_KOM4 |m P01UTAMA |r Y |s Y |t TESIS |u 31/12/2002 |o .PUBLIC. BKOM 4 : 45477 | ||