APA引文

Chu, L. W. (2001). A resistance-noise model for the investigation of interconnect voiding and reliability.

Chicago Style (17th ed.) Citation

Chu, Lip Wei. A Resistance-noise Model for the Investigation of Interconnect Voiding and Reliability. 2001.

MLA引文

Chu, Lip Wei. A Resistance-noise Model for the Investigation of Interconnect Voiding and Reliability. 2001.

警告：这些引文格式不一定是100％准确.