APA (7th ed.) Citation

Kim, S. J. (2001). Effect of X-ray lithography on MOS device reliability.

Chicago Style (17th ed.) Citation

Kim, Sun Jung. Effect of X-ray Lithography on MOS Device Reliability. 2001.

MLA (8th ed.) Citation

Kim, Sun Jung. Effect of X-ray Lithography on MOS Device Reliability. 2001.

Warning: These citations may not always be 100% accurate.