APA引文

Kim, S. J. (2001). Effect of X-ray lithography on MOS device reliability.

Chicago Style (17th ed.) Citation

Kim, Sun Jung. Effect of X-ray Lithography on MOS Device Reliability. 2001.

MLA引文

Kim, Sun Jung. Effect of X-ray Lithography on MOS Device Reliability. 2001.

警告：这些引文格式不一定是100％准确.