Chen, K. K. (2002). Study of gate oxide degradation using photon emission spectroscopy.
Chicago Style (17th ed.) CitationChen, Kok Kiong. Study of Gate Oxide Degradation Using Photon Emission Spectroscopy. 2002.
MLA (8th ed.) CitationChen, Kok Kiong. Study of Gate Oxide Degradation Using Photon Emission Spectroscopy. 2002.
Warning: These citations may not always be 100% accurate.