Chen, K. K. (2002). Study of gate oxide degradation using photon emission spectroscopy.
Chicago Style (17th ed.) CitationChen, Kok Kiong. Study of Gate Oxide Degradation Using Photon Emission Spectroscopy. 2002.
MLA引文Chen, Kok Kiong. Study of Gate Oxide Degradation Using Photon Emission Spectroscopy. 2002.
警告:这些引文格式不一定是100%准确.