Xia, J. (2002). I-V hysteresis characterization of deep-submicron mos devices.
Chicago Style (17th ed.) CitationXia, Jinghua. I-V Hysteresis Characterization of Deep-submicron Mos Devices. 2002.
MLA (8th ed.) CitationXia, Jinghua. I-V Hysteresis Characterization of Deep-submicron Mos Devices. 2002.
Warning: These citations may not always be 100% accurate.