Sin, C. Y. (2002). Photoresist trimming technique in high-density oxygen-based plasmas for sub-0.1 um mosfet fabrication using 248-nm lithography.
Chicago Style (17th ed.) CitationSin, Chian Yuh. Photoresist Trimming Technique in High-density Oxygen-based Plasmas for Sub-0.1 Um Mosfet Fabrication Using 248-nm Lithography. 2002.
MLA (8th ed.) CitationSin, Chian Yuh. Photoresist Trimming Technique in High-density Oxygen-based Plasmas for Sub-0.1 Um Mosfet Fabrication Using 248-nm Lithography. 2002.
Warning: These citations may not always be 100% accurate.