Study of plasma induced charging damage at CMOS gate process /

Study of plasma induced charging damage at CMOS gate process /

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Chong, Daniel Kien Seen
التنسيق:	أطروحة كتاب
اللغة:	English
منشور في:	2002.
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

مواد مشابهة

Plasma charge damage in submicron process /
بواسطة: Song, Jun
منشور في: (1999)

Plasma-induced damage-microtrenching and pitting /
بواسطة: Chua, Cher Sian
منشور في: (2002)

Plasma-induced damage to gallium nitride /
بواسطة: Choi, Hoi Wai
منشور في: (2002)

An accurate delay model for BiCMOS/CMOS logic gates /
بواسطة: Zhao, Bin
منشور في: (1999)

Plasma process-induced damage to oxide/nitride/oxide (ONO) interpoly dielectric in flash memory devices /
بواسطة: Cha, Cher Liang
منشور في: (2001)

Development of ultra-thin nitrogen-rich gate oxide process for deep submicron CMOS technology /
بواسطة: Lek, Chun Meng
منشور في: (2002)

Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
بواسطة: Yasmin Abdul Wahab
منشور في: (2015)

A low voltage dual gate integrated CMOS mixer for bluetooth/Wi-Fi application /
بواسطة: Cui, Jiqing
منشور في: (2002)

Void formation in P+ Ti-Salicided Polysilicon gate electrode in deep sub-quarter-micron CMOS Technology /
بواسطة: Chua, Hwee Ngoh
منشور في: (2000)

Study and analysis of surface charge collection and emission spectrum of plasma ashing process
بواسطة: Sivapathy, Kanthaan
منشور في: (2019)

Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
بواسطة: Goh, Yong Han
منشور في: (1997)

Gate oxide short (gos) defect modeling based on 32 nm CMOS process
بواسطة: Alawey, Sahar Z
منشور في: (2014)

Gate oxide integrity study /
بواسطة: Lee, Joshua Wai Khin
منشور في: (1999)

Performance of advanced-process and multi-gated mosfets based on geometric and process design considerations /
بواسطة: Fazliyatul Azwa Md Rezali
منشور في: (2017)

Impact of laser energy and gate delay on self-absorption of emission lines in laser induced plasma spectroscopy
بواسطة: Mohd. Sabri, Nursalwanie
منشور في: (2018)

CMOS compatible vertical surround gate mosfets with reduced parasitics /
بواسطة: Kunz, Veit Dominik
منشور في: (2003)

Application of NH4F chemistry for the pre-gate oxidation cleaning process /
بواسطة: Teo, Eric Yeow Hwee
منشور في: (2002)

Integration of self-aligned silicide (salicide) process for sub-0.25 [mu]m CMOS technology /
بواسطة: Ho, Chaw Sing
منشور في: (2002)

Development of gate oxide short (GOS) model for deep submicron CMOS transistor
بواسطة: Cheow, Kwee Siong
منشور في: (2005)

Study of gate oxide degradation using photon emission spectroscopy /
بواسطة: Chen, Kok Kiong
منشور في: (2002)

Plasma etching process for aluminum-copper metallization by photoresist margin improvement for CMOS 0.13-µm technology
بواسطة: Mohamed Hassan, Wan Faizal
منشور في: (2022)

Design of radio frequency CMOS low noise amplifier /
بواسطة: Liu, Xiaoyun
منشور في: (2002)

Design of wideband cmos mixer for cognitive radio receiver /
بواسطة: Nandini Vitee
منشور في: (2015)

Static current and voltage techniques for CMOS reliability characterization /
بواسطة: Jie, Bin Bin
منشور في: (1999)

Design of standard CMOS time-of-flight pixel using charge transfer efficiency method
بواسطة: Din, Amad Ud
منشور في: (2011)

Study on dual gate oxide integrity for system-on-a-chip technology /
بواسطة: Zhuang, Ziyun
منشور في: (2002)

Fabrication and reliability study of ultrathin nitride/oxide gate stack and oxynitride /
بواسطة: Lin, Wenhe
منشور في: (2002)

A study of the quasi-breakdown mechanism in ultra-thin gate oxide /
بواسطة: Xu, Zhen
منشور في: (2000)

Charge-based compact model of gate-all-around floating gate nanowire with variable oxide thickness for flash memory cell
بواسطة: Hamzah, Muhammad Afiq Nurudin
منشور في: (2018)

Laser-induced damage in solids /
بواسطة: Ramli Jaya
منشور في: (1983)

Low-power CMOS cross-coupled differential-drive rectifier for ambient radio frequency energy harvesting systems /
بواسطة: Chong, Gabriel Sing Leung
منشور في: (2020)

A study of charge injection and removal in a floating gate ionisation- injection NOS [FIMOS] cell /
بواسطة: Lee, Kok Choy
منشور في: (1987)

The effect of nitrogen incorporation into gate oxide by nitrogen implantation /
بواسطة: Ko, Lian Hoon
منشور في: (1999)

CMOS low voltage rail-to-rail integrators for Gm-C filters /
بواسطة: Shi, Qian
منشور في: (1999)

Inductively coupled plasma etching of silicon /
بواسطة: Xu, Xinhai
منشور في: (2002)

Technique of failure analysis for gate oxide defect of Bi-polar CMOS Diffuse (BCD) technology
بواسطة: Abdullah, Farisal
منشور في: (2013)

Optimal electric vehicles charging scheduling based on evolutionary programing /
بواسطة: Usman, Muhammad
منشور في: (2017)

Analysis and optimisation of dual-gate IGBT for soft-switching application /
بواسطة: Yuan, Xiaolu
منشور في: (1999)

New investigation in ultra-thin gate oxide degradation phenomena /
بواسطة: Guan, Hao
منشور في: (2001)

Design of interface circuit using dual-chopper amplifier for CMOS-MEMS applications /
بواسطة: Siti Amaniah Mohd Chachuli
منشور في: (2012)

Services hosted by the Perpustakaan Sultan Abdul Samad, Universiti Putra Malaysia with Cooperation MySyL Group