Characterization of polished silicon wafer /

Saved in:
Bibliographic Details
Main Author: Rajan Subramaniam
Format: Thesis Book
Language:English
Published: 2003.
Subjects:
Online Access:http://studentsrepo.um.edu.my/id/eprint/2048
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Physical Description:[vi], 155 leaves : ill. ; 30 cm.
Bibliography:Bibliography : leaves 139-142.