Heng, A. S. (1988). Integrated testing and algorithms for computer visual inspection of integrated circuits.
Chicago Style (17th ed.) CitationHeng, Aik Swan. Integrated Testing and Algorithms for Computer Visual Inspection of Integrated Circuits. 1988.
MLA (8th ed.) CitationHeng, Aik Swan. Integrated Testing and Algorithms for Computer Visual Inspection of Integrated Circuits. 1988.
Warning: These citations may not always be 100% accurate.