APA引文

Heng, A. S. (1988). Integrated testing and algorithms for computer visual inspection of integrated circuits.

Chicago Style (17th ed.) Citation

Heng, Aik Swan. Integrated Testing and Algorithms for Computer Visual Inspection of Integrated Circuits. 1988.

MLA引文

Heng, Aik Swan. Integrated Testing and Algorithms for Computer Visual Inspection of Integrated Circuits. 1988.

警告：這些引文格式不一定是100％准確.