Integrated testing and algorithms for computer visual inspection of integrated circuits /
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| 主要作者: | |
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| 格式: | Thesis 圖書 |
| 語言: | English |
| 出版: |
1988
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| LEADER | 00818cam a2200241 4500 | ||
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| 001 | u54566 | ||
| 003 | SIRSI | ||
| 008 | 900219s1988 si v 00 1 eng m | ||
| 035 | |a AAF-8648 | ||
| 040 | |a UMM | ||
| 090 | |a TA1632 |b Hen | ||
| 100 | 1 | 0 | |a Heng, Aik Swan. |
| 245 | 1 | 0 | |a Integrated testing and algorithms for computer visual inspection of integrated circuits / |c by Heng Aik Swan. |
| 260 | |c 1988 | ||
| 300 | |a xii, 202 leaves ; |c 29cm. | ||
| 500 | |a Photocopy | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 1988. | ||
| 504 | |a Bibliography: leaves 192-198. | ||
| 650 | 0 | |a Computer vision. | |
| 650 | 0 | |a Integrated circuits |x Design and construction |x Data processing. | |
| 948 | |a 16/03/1991 |b 28/08/2002 | ||
| 596 | |a 1 | ||
| 999 | |a TA1632 HEN |w LC |c 1 |i A010670643 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 19/2/1992 | ||