rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Integrated testing and algorithms for computer visual inspection of integrated circuits
  name:
    name part: Heng, Aik Swan.
    role:
      role term: creator
  type of resource: text
  genre: legal case and case notes
  origin info:
    place:
      place term: si
    date issued: 1988
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xii, 202 leaves ; 29cm.
  note: by Heng Aik Swan.
  note: Photocopy
  note: Dissertation (M.Eng.) -- National University of Singapore, 1988.
  note: Bibliography: leaves 192-198.
  subject:
    topic: Computer vision
  subject:
    topic: Integrated circuits
    topic: Design and construction
    topic: Data processing
  record info:
    record content source: UMM
    record creation date: 900219
    record identifier: u54566