APA (7th ed.) Citation

Jie, B. B. (1999). Static current and voltage techniques for CMOS reliability characterization.

Chicago Style (17th ed.) Citation

Jie, Bin Bin. Static Current and Voltage Techniques for CMOS Reliability Characterization. 1999.

MLA (8th ed.) Citation

Jie, Bin Bin. Static Current and Voltage Techniques for CMOS Reliability Characterization. 1999.

Warning: These citations may not always be 100% accurate.