APA引文

Jie, B. B. (1999). Static current and voltage techniques for CMOS reliability characterization.

Chicago Style (17th ed.) Citation

Jie, Bin Bin. Static Current and Voltage Techniques for CMOS Reliability Characterization. 1999.

MLA引文

Jie, Bin Bin. Static Current and Voltage Techniques for CMOS Reliability Characterization. 1999.

警告：这些引文格式不一定是100％准确.