Static current and voltage techniques for CMOS reliability characterization /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1999.
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| LEADER | 00853cam a2200217 a 4500 | ||
|---|---|---|---|
| 001 | u685015 | ||
| 003 | SIRSI | ||
| 008 | 000929s1999 si v 00 10 eng m | ||
| 035 | |a ACM-3370 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUSP 1999 Jie | ||
| 100 | 1 | 0 | |a Jie, Bin Bin. |
| 245 | 1 | 0 | |a Static current and voltage techniques for CMOS reliability characterization / |c by Jie Bin Bin. |
| 260 | |c 1999. | ||
| 300 | |a xxi, 155 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Thesis (Ph.D.) -- Dept. of Electrical Engineering, Faculty of Engineering, National University of Singapore, 1999. | ||
| 504 | |a Include bibliographical references. | ||
| 650 | 0 | |a Metal oxide semiconductors, Complementary. | |
| 948 | |a 02/10/2000 |b 12/01/2004 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUSP 1999 JIE |w LC |c 1 |i A509932363 |d 10/7/2006 |f 10/7/2006 |g 1 |l B_KOM4 |m P01UTAMA |r Y |s Y |t TESIS |u 4/2/2005 |o .PUBLIC. BKOM 4 : 46058 | ||