Characterization of rapid thermal oxide films /

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Bibliographic Details
Main Author: Lai, Weng Hong
Format: Thesis Book
Language:English
Published: 2001.
Subjects:
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035 |a ACV-8955 
040 |a UMM 
090 |a TK7  |b NUSP 2001 Lai 
100 1 0 |a Lai, Weng Hong. 
245 1 0 |a Characterization of rapid thermal oxide films /  |c Lai Weng Hong. 
260 |c 2001. 
300 |a xiii, 177 leaves :  |b ill. ;  |c 30 cm. 
502 |a Thesis (Ph.D.) -- Dept. of Electrical & Computer Engineering, Faculty of Engineering, National University of Singapore, 2001. 
504 |a Bibliography: leaves 167-172. 
650 0 |a Rapid thermal processing. 
948 |a 08/10/2002  |b 08/10/2002 
596 |a 1 
999 |a TK7 NUSP 2001 LAI  |w LC  |c 1  |i A510772042  |d 24/8/2006  |f 24/8/2006  |g 1  |l B_KOM4  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 21/7/2005  |o .PUBLIC. BKOM 4 :43102