APA (7th ed.) Citation

Ang, C. H. (2000). Ultra-thin gate oxide reliability.

Chicago Style (17th ed.) Citation

Ang, Chew Hoe. Ultra-thin Gate Oxide Reliability. 2000.

MLA (8th ed.) Citation

Ang, Chew Hoe. Ultra-thin Gate Oxide Reliability. 2000.

Warning: These citations may not always be 100% accurate.