Ng, C. M. (2001). Ultra shallow secondary ion mass spectrometric studies on semiconductors.
Chicago Style (17th ed.) CitationNg, Chee Mang. Ultra Shallow Secondary Ion Mass Spectrometric Studies on Semiconductors. 2001.
MLA (8th ed.) CitationNg, Chee Mang. Ultra Shallow Secondary Ion Mass Spectrometric Studies on Semiconductors. 2001.
Warning: These citations may not always be 100% accurate.