APA引文

Ng, C. M. (2001). Ultra shallow secondary ion mass spectrometric studies on semiconductors.

Chicago Style (17th ed.) Citation

Ng, Chee Mang. Ultra Shallow Secondary Ion Mass Spectrometric Studies on Semiconductors. 2001.

MLA引文

Ng, Chee Mang. Ultra Shallow Secondary Ion Mass Spectrometric Studies on Semiconductors. 2001.

警告：这些引文格式不一定是100％准确.