APA (7th ed.) Citation

Guan, H. (2001). New investigation in ultra-thin gate oxide degradation phenomena.

Chicago Style (17th ed.) Citation

Guan, Hao. New Investigation in Ultra-thin Gate Oxide Degradation Phenomena. 2001.

MLA (8th ed.) Citation

Guan, Hao. New Investigation in Ultra-thin Gate Oxide Degradation Phenomena. 2001.

Warning: These citations may not always be 100% accurate.