APA引文

Guan, H. (2001). New investigation in ultra-thin gate oxide degradation phenomena.

Chicago Style (17th ed.) Citation

Guan, Hao. New Investigation in Ultra-thin Gate Oxide Degradation Phenomena. 2001.

MLA引文

Guan, Hao. New Investigation in Ultra-thin Gate Oxide Degradation Phenomena. 2001.

警告：这些引文格式不一定是100％准确.