APA引文

Lim, P. S. (2001). Latent damage generation in silicon dioxide under high-field impulse and constant-bias stressing.

Chicago Style (17th ed.) Citation

Lim, Peng Soon. Latent Damage Generation in Silicon Dioxide Under High-field Impulse and Constant-bias Stressing. 2001.

MLA引文

Lim, Peng Soon. Latent Damage Generation in Silicon Dioxide Under High-field Impulse and Constant-bias Stressing. 2001.

警告：这些引文格式不一定是100％准确.