http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET
Thesis (Ph.D.) -- Dept. of Electrical & Computer Engineering, Faculty of Engineering, National University of Singapore, 2002.
Metal oxide semiconductor field-effect transistors