Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET /

Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET /

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Lun, Zhao
التنسيق:	أطروحة كتاب
اللغة:	English
منشور في:	2002.
الموضوعات:	Silicon-on-insulator technology. Metal oxide semiconductor field-effect transistors.
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

مواد مشابهة

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