Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET /

Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET /

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书目详细资料
主要作者:	Lun, Zhao
格式:	Thesis 图书
语言:	English
出版:	2002.
主题:	Silicon-on-insulator technology. Metal oxide semiconductor field-effect transistors.
标签:	添加标签没有标签, 成为第一个标记此记录!

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